{"id":4515,"date":"2017-01-31T17:04:11","date_gmt":"2017-01-31T22:04:11","guid":{"rendered":"http:\/\/easinc.org\/wordpress\/?page_id=4515"},"modified":"2017-07-12T19:58:13","modified_gmt":"2017-07-12T23:58:13","slug":"e17-introduction-atomic-force-microscopy-afm-industrial-applications","status":"publish","type":"page","link":"https:\/\/eas.org\/2024\/e17-introduction-atomic-force-microscopy-afm-industrial-applications\/","title":{"rendered":"E17-11: Introduction to Atomic Force Microscopy (AFM) for Industrial Applications"},"content":{"rendered":"
One-Day Course
Sunday, November 12; 8:30am – 5:00pm<\/em><\/b><\/div>\n

Dr.\u00a0Dalia Yablon, SurfaceChar, Sharon, MA<\/p>\n

COURSE DESCRIPTION
\n<\/strong>Atomic force microscopy (AFM) is a powerful microscopy method that images and measures surface properties such as topography, morphology, and mechanics with nanometer resolution in a variety of environments including air and fluids.\u00a0 The AFM operates through a unique, mechanical interaction between probe and sample.\u00a0 Though it was invented only 30 years ago, it has quickly penetrated into industrial R&D for quality control, structure-property relationship investigations, improved product formulation, enhanced processes, and new business opportunities.\u00a0 \u00a0AFMs are now routinely used in a variety of industries including:\u00a0 chemicals, pharma, semiconductor, and personal care.\u00a0 This course will introduce attendees to the technology and widespread capabilities of AFM with a focus on utility in industrial applications, and in the final segment offer practical advice for users on getting the most out of their AFM measurements.\u00a0 \u00a0This course is intended to supplement the 2017 EAS research symposium of \u201cIndustrial Applications of AFM\u201d.<\/p>\n

WHO SHOULD ATTEND<\/strong>
\nThis one-day course will benefit technicians, researchers and managers from a broad range of science or engineering backgrounds who seek an introduction to AFM and its capabilities. \u00a0No prior AFM experience or knowledge is assumed, but having freshman level physics background is recommended.<\/p>\n

TOPICS
\n<\/strong>1. \u00a0Overview of AFM\u00a0<\/span>
\u00a0 \u00a0 \u00a0* Brief history\u00a0<\/span>
\u00a0 \u00a0 \u00a0* Overview of operation<\/span>
\u00a0 \u00a0 \u00a0* Resolution\u00a0<\/span>
\u00a0 \u00a0 \u00a0* Overview of modes<\/span><\/p>\n

2. \u00a0Mechanical Property Measurements
\u00a0 \u00a0 \u00a0* Nanoindentation\u00a0
\u00a0 \u00a0 \u00a0* Phase imaging\u00a0
\u00a0 \u00a0 \u00a0* Force spectroscopy\u00a0
\u00a0 \u00a0 \u00a0* Advanced methods \u2013 multifrequency, contact resonance, force modulation<\/p>\n

3.\u00a0Hybrid Methods\u00a0
\u00a0 \u00a0 \u00a0* AFM-Raman and TERS\u00a0
\u00a0 \u00a0 \u00a0* AFM-IR\u00a0
\u00a0 \u00a0 \u00a0* NSOM\/SNOM<\/p>\n

4. \u00a0Tips for Users\u00a0
\u00a0 \u00a0 \u00a0* Image processing and analysis\u00a0
\u00a0 \u00a0 \u00a0* Imaging Artifacts\u00a0
\u00a0 \u00a0 \u00a0* Tip shape characterization\u00a0
\u00a0 \u00a0 \u00a0* Calibrations\u00a0
\u00a0 \u00a0 \u00a0* Hardware nonlinearities<\/p>\n

<\/a>ABOUT THE INSTRUCTOR
\nDr.\u00a0Dalia Yablon<\/strong> holds an A.B. in Chemistry from Harvard University and a Ph.D. in Physical Chemistry from Columbia University.\u00a0 She spent 11 years at ExxonMobil Research and Engineering\u2019s Corporate Strategic Research, its flagship research center in Annandale NJ.\u00a0 At ExxonMobil, she served as Program Leader in various sectors of the energy business and developed a state of the art scanning probe microscopy\/nanoindentation laboratory for nanoscale characterization of surfaces and interfaces.\u00a0 She has worked in a number of cross-sector areas including polymers, tribology, lubrication, corrosion and unconventional gas resources with a specific focus on developing new nanomechanical characterization methods.\u00a0 In 2013, Dalia founded a scientific consulting company in the greater Boston area, SurfaceChar, a surfaces and interfaces characterization, measurement, and educational\/training consulting service with a focus on scanning probe microscopy\/atomic force microscopy.\u00a0 Dalia\u2019s edited book, \u201cScanning Probe Microscopy in Industrial Applications\u201d was published in 2013 by Wiley.<\/p>\n","protected":false},"excerpt":{"rendered":"

One-Day Course Sunday, November 12; 8:30am – 5:00pm Dr.\u00a0Dalia Yablon, SurfaceChar, Sharon, MA COURSE DESCRIPTION Atomic force microscopy (AFM) is a powerful microscopy […]<\/p>\n","protected":false},"author":2,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"open","template":"","meta":{"footnotes":"","_links_to":"","_links_to_target":""},"class_list":["post-4515","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/eas.org\/2024\/wp-json\/wp\/v2\/pages\/4515"}],"collection":[{"href":"https:\/\/eas.org\/2024\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/eas.org\/2024\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/eas.org\/2024\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/eas.org\/2024\/wp-json\/wp\/v2\/comments?post=4515"}],"version-history":[{"count":2,"href":"https:\/\/eas.org\/2024\/wp-json\/wp\/v2\/pages\/4515\/revisions"}],"predecessor-version":[{"id":4729,"href":"https:\/\/eas.org\/2024\/wp-json\/wp\/v2\/pages\/4515\/revisions\/4729"}],"wp:attachment":[{"href":"https:\/\/eas.org\/2024\/wp-json\/wp\/v2\/media?parent=4515"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}